Skip to main content
Rapid Communication
01 September 1993

Novel technique to combine BWS and FWS classifiers

Abstract

A novel approach to combining the binary weighted and frequency weighted schemes (BWS and FWS) for pattern classification is described. The method presented employs a well established statistical procedure and offers good performance. The principal advantages of the technique are that only a single layer is required and it avoids the serious problem of choosing optimal values for the zero-frequency components which occur in the FWS. Preliminary experiments demonstrate that the choice of operational parameters required is straightforward. Furthermore, the technique is intrinsically parallel and lends itself naturally to parallel implementation.

Get full access to this article

View all available purchase options and get full access to this article.

References

1.
Fairhurst M.C. and Wahab H.M.S.A. An approach to performance optimization in frequency weighted memory network pattern classifiers Electron. Lett. 23 21 1116-1118 1987
2.
Fairhurst M.C., Mattoso Maia, and MAG Stabilisation of errorrate performance in frequency weighted memory network pattern classifier Pattern Recognition Lett. 10 3 159-166 1989
3.
Fairhurst M.C., Mattoso Maia, and MAG A two layer memory network architecture for a pttern classifer Pattern Recognition Lett. 1 4 267-271 1983
4.
Fairhurst M.C., Mattoso Maia, and MAG Configuration selection for two-layer memory network pattern classifiers Electron. Lett. 21 21 963-964 1985 10
5.
Hand D.J. Discrimination and classification John Wiley & Sons 1981
6.
Ullman J.R. Experiment with the N-tuple method of pattern recognition IEEE Trans. C-18 1135-1137 1969
7.
Fairhurst M.C. and Kormilo S.R. Some economic consideration in the design of an optimal N-tuple pattern classifier Digital Processing 3 321-329 1977
8.
Toussaint G.T. Bibliography on estimation of misclassification IEEE Trans. IT-20 472-479 1974

Information & Authors

Information

Published in

History

Published online: 01 September 1993
Published in print: 16 September 1993

Inspec keywords

  1. pattern recognition
  2. statistical analysis

Keywords

  1. binary weighted schemes
  2. frequency weighted schemes
  3. pattern classification
  4. statistical procedure
  5. operational parameters
  6. parallel implementation

Keywords

  1. Neural networks
  2. Pattern recognition

Authors

Affiliations

K.P. Lam
Computing Laboratory, University of Kent at Canterbury, Canterbury, Kent, UK
E. Home
Electronic Engineering Laboratory, University of Kent at Canterbury, Canterbury, Kent, UK

Metrics & Citations

Metrics

Citations

If you have the appropriate software installed, you can download article citation data to the citation manager of your choice. Simply select your manager software from the list below and click Download.

View Options

Access content
Login options
Buy this article
Novel technique to combine BWS and FWS classifiers

View options

PDF

View PDF

Figures

Tables

Media

Share

Share

Copy the content Link

Share on social media