IEE Review
Volume 43, Issue 2, March 1997
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Volume 43, Issue 2
March 1997
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- Source: IEE Review, Volume 43, Issue 2, p. 42 –43
- DOI: 10.1049/ir:19970206
- Type: Article
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- Source: IEE Review, Volume 43, Issue 2, page: 44 –44
- DOI: 10.1049/ir:19970207
- Type: Article
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- Source: IEE Review, Volume 43, Issue 2, page: 46 –46
- DOI: 10.1049/ir:19970208
- Type: Article
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- Author(s): L. Hatton
- Source: IEE Review, Volume 43, Issue 2, p. 49 –52
- DOI: 10.1049/ir:19970201
- Type: Article
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Software failure is becoming a serious issue. Ariane 5 provided a recent spectacular example of how a simple mistake, entirely avoidable, was allowed to sneak through the software verification stage and cause an immensely expensive failure. However, it is not just the aerospace industry which suffers such traumas. Here, the author discusses some common misconceptions. - Source: IEE Review, Volume 43, Issue 2, page: 54 –54
- DOI: 10.1049/ir:19970209
- Type: Article
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- Author(s): F. Acker
- Source: IEE Review, Volume 43, Issue 2, p. 55 –58
- DOI: 10.1049/ir:19970202
- Type: Article
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The author reports on how a controversial $30 billion project to create one of the world's largest hydroelectric power plant installations is just one aspect of China's rapidly expanding electricity industry. - Source: IEE Review, Volume 43, Issue 2, page: 58 –58
- DOI: 10.1049/ir:19970210
- Type: Article
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- Author(s): D. Everett
- Source: IEE Review, Volume 43, Issue 2, p. 59 –62
- DOI: 10.1049/ir:19970203
- Type: Article
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Cash, cheque, credit card, debit card, store card-methods of payment can seem bewildering in their variety. Here, the author describes how the Mondex system of electronic cash could bring order, convenience and security to the inescapable need to pay for goods and services. - Source: IEE Review, Volume 43, Issue 2, page: 64 –64
- DOI: 10.1049/ir:19970211
- Type: Article
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- Author(s): J. Midwinter
- Source: IEE Review, Volume 43, Issue 2, p. 66 –70
- DOI: 10.1049/ir:19970204
- Type: Article
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As UK universities digest the results of the 1996 HEFC Research Assessment Exercise, the author reports on the work of the panel that was responsible for appraising the quality of research staff in the country's electrical engineering departments. - Author(s): R. Dettmer
- Source: IEE Review, Volume 43, Issue 2, p. 71 –73
- DOI: 10.1049/ir:19970205
- Type: Article
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The microelectronics revolution was founded on the affinity between electrons and silicon. Here, the author reports on one company's plans to transform the capabilities of optical circuits by the seemingly incompatible marriage of photons and silicon into low-cost integrated optoelectronic circuits. - Source: IEE Review, Volume 43, Issue 2, p. 74 –75
- DOI: 10.1049/ir:19970212
- Type: Article
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- Source: IEE Review, Volume 43, Issue 2, page: 76 –76
- DOI: 10.1049/ir:19970213
- Type: Article
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News
New products
In brief
Software failures: follies and fallacies
European report
Electricity in China
From the IEE Archives
Cowry shell to smart card
Westminster report
A question of quality
New light on silicon
Book reviews
Letters
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