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IEE Proceedings E (Computers and Digital Techniques)

Volume 129, Issue 3, May 1982

Volume 129, Issue 3

May 1982

Lifetime analyses of error-control coded semiconductor RAM systems
Detection and location of errors by linear inequality checks
Statistical efficiency of universal logic elements in realisation of logic functions
Signal classification for automatic industrial inspection
Realisation of multithreshold threshold-logic gates using charge-coupled devices
Tabular implementation for the ternary functions of two variables
M/G/1 queue analysis via the inverse Poisson transform
Distributed multiple-microprocessor network
Data Structure Techniques
Erratum: Fast transform procedure for the generation of near-minimal covers of Boolean functions

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