IEE Proceedings - Computers and Digital Techniques

Volume 153, Issue 1, January 2006

Volume 153, Issue 1

January 2006

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    • Memory test experiment: industrial results and data
      Theory and practice of automatic design constraint generation
      Design and implementation of a Java processor
      Linear complexity of modulo-m related prime sequences
      Reducing the number of specified values per test vector by increasing the test set size
      Gigabyte per second streaming lossless data compression hardware based on a configurable variable-geometry CAM dictionary
      Memory access scheduling and binding considering energy minimisation in multi-bank memory systems: integrated approach

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