IEE Proceedings - Computers and Digital Techniques

Volume 150, Issue 4, July 2003

Volume 150, Issue 4

July 2003

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    • Interactive built-in self-test compression for testing a system-on-a-chip
      Built-in self-repair techniques for embedded RAMs
      Dual multiple-polynomial LFSR for low-power mixed-mode BIST
      Multilevel logic simplification based on a containment recursive paradigm
      Scalable techniques for system-level cosimulation and coestimation
      Generic architecture and semiconductor intellectual property cores for advanced encryption standard cryptography
      Handshake protocol using return-to-zero data encoding for high performance asynchronous bus

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