IEE Proceedings - Circuits, Devices and Systems

Volume 149, Issue 1, February 2002

Volume 149, Issue 1

February 2002

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    • Editorial: Selected topics on electronic noise
      1/f noise in homogeneous and inhomogeneous media
      Electrical noise as a reliability indicator in electronic devices and components
      Low-frequency noise in deep-submicron metal–oxide–semiconductor field-effect transistors
      Low frequency and 1/f noise in wide-gap semiconductors: silicon carbide and gallium nitride
      Low-frequency noise in polysilicon-emitter bipolar transistors
      Has SiGe lowered the noise in transistors?
      Low-frequency noise in III–V high-speed devices
      Noise in hydrogenated amorphous silicon
      Low frequency noise in thin film transistors

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