IEE Journal on Solid-State and Electron Devices

Volume 1, Issue 5, September 1977

Volumes & issues:

Volume 1, Issue 5

September 1977

Switching characteristics of m.n.o.s. memory transistors
Contactless nondestructive technique for the measurement of minority-carrier lifetime and diffusion length in silicon
In-circuit characterisation technique for barritt diodes and other 2-terminal negative-resistance oscillator devices
Erratum: Design of c.c.d. delay lines with floating-gate taps
Field-emission microwave amplifier: a reappraisal
Interdiffusion of Cr/Pt/Ag metallisation layers on silicon impatt diodes
Use of impatt diodes as fast avalanche photodetectors
Optical losses in O+ and B+ implanted GaAs for stripe laser

Most viewed content for this Journal


Most cited content for this Journal

We currently have no most cited data available for this content.

This is a required field
Please enter a valid email address