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image of Volume 38, Issue 15
Online ISSN 1350-911X Print ISSN 0013-5194

Electronics Letters

Volume 38, Issue 15, 18 July 2002


Volume 38, Issue 15

18 July 2002

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    • BIST scheme for DAC testing
      Low-power CSD linear phase FIR filter structure using vertical common sub-expression

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