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image of Volume 20, Issue 23
Online ISSN 1350-911X Print ISSN 0013-5194

Electronics Letters

Volume 20, Issue 23, 8 November 1984


Volume 20, Issue 23

8 November 1984

Theoretical comparison of IBC solar cells with N- and P-type substrate under high and very high illumination
Time delay spread measurements of wideband radio signals within a building
Digital measurement of polysilicon to diffusion misalignment for a silicon gate MOS process
Simple in-service method for monitoring DMI code errors
InSb MOS structures fabricated by a novel thermal oxidation method
InGaAs/InP heterobipolar transistors for integration on semi-insulating InP substrates
Monolithic 1.5 μm hybrid DFB/DBR lasers with 5 nm tuning range
Analysis of low-frequency noise reduction by autozero technique
Microsphere and magnetic-fluid mixtures as magnetoresistors
Comment: Near room temperature 1.3 μm single photon counting with an InGaAs avalanche photodiode
Reply: Near room temperature 1.3 μm single photon counting with an InGaAs avalanche photodiode
In-line single-mode wavelength division multiplexer/demultiplexer
Modal and relative intensity noise under VHF modulation in InGaAsP/InP lasers before and after degradation
Two-way circuits with inverse transmission properties
Linear thin-film Bragg modulator
Surface plasmon resonance and immunosensors
‘Orwell’: a protocol for carrying integrated services on a digital communications ring
Hybrid IR/RF transmission system with common modulating circuit
Reflection induced frequency shifts in single-mode laser diodes coupled to optical fibres
Simple and practical technique for attaching single-mode fibres to lithium niobate waveguides
Small loss-deviation tapered fibre star coupler with mixer rod
New approach to growth of abrupt heterojunctions by MOVPE
Influence of feed-point location on radiation resistance of a short-circuited flat dipole
Simultaneous phase and amplitude measurements on optical signals using a multiport junction
Fibre optic device for simultaneous laser power transmission and temperature measuring of irradiated object
Temperature distribution in a light-emitting diode during a pulse operation
Efficient ARQ scheme for high error rate channels

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