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image of Volume 19, Issue 22
Online ISSN 1350-911X Print ISSN 0013-5194

Electronics Letters

Volume 19, Issue 22, 27 October 1983


Volume 19, Issue 22

27 October 1983

Integrated PINFET optical receiver with high-frequency InP-MISFET
Rayleigh wave suppression in reflection acoustic microscopy
140 GHz 70 mW CW output power with n-type silicon single-drift impatt diodes
560 Mbit/s transmission experiment using 1.3 μm InGaAsP/InP LED
Three-Line microstrip directional coupler with dielectric overlay
Offset spherical dual-reflector antenna
Attenuation changes in optical fibres due to hydrogen
Increased attenuation in optical fibres caused by diffusion of molecular hydrogen at room temperature
Photochemical microetching of GaAs
Broadband six-port reflectometer junction
Elastic profile measurements of optical fibres via reflection acoustic microscopy
Lattice-Matched and mismatched multiquantum-well heterostructure photodiodes for operation at 1.1 to 1.5 μm
Electrical tuning of semiconductor interferometric laser
Measurements of the semiconductor laser linewidth broadening factor
M-type electrode planar guided-wave beam splitter
4–20 GHz magnetostatic-wave delay-line oscillator
Sidelobe reduction using random methods for antenna arrays
Imaging spatial distributions of resistivity using applied potential tomography
Linewidth broadening in semiconductor lasers due to mode competition noise
Optimum choice of Si FET or GaAs FET as first-stage active device for very low-noise optical receivers with medium bandwidths
Spectral linewidth reduction in semiconductor lasers by an external cavity with weak optical feedback
High-speed infra-red modulator with multilayered pn-junctions
High-quality 1.3 μm GaInAsP/InP BH-DFB lasers with first-order gratings
Theory of integrated-optic diffraction gratings in low Δn waveguides
Miniature 90 MHz low-loss narrowband SAW filter using new resonant configuration
Estimation of minimum-phase impulse response
Analytic transformation of the generation-recombination centres in the transmission-line equivalent-circuit model of a semiconductor
Real-Time feature-extraction architecture for moving-picture transmission over telephone lines

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