© The Institution of Engineering and Technology
The acquisition of a high-quality imaging performance by an atomic force microscope is significantly influenced by the motion coupling effect of its key scanning unit, i.e. its piezoelectric tube scanner. In this Letter, to improve its performance, a MIMO model predictive control scheme for reducing this effect is proposed. The proposed controller achieves this by greatly overcoming the problem of tilted characters in the atomic force microscopy (AFM) scanned images. The experimental results are demonstrating the effectiveness of the proposed control technique.
References
-
-
1)
-
7. Rana, M.S., Pota, H.R., Petersen, I.R.: ‘Spiral scanning with improved control for faster imaging of AFM’, IEEE Trans. Nanotechnol., 2014, 13, (3), pp. 541–550 (doi: 10.1109/TNANO.2014.2309653).
-
2)
-
1. Watanabe, H., Uchihashi, T., Kobashi, T., et al: ‘Wide-area scanner for high-speed atomic force microscopy’, Rev. Sci. Instrum., 2013, 84, (5), pp. 053702–1–053702–10 (doi: 10.1063/1.4803449).
-
3)
-
5. Yong, Y.K., Liu, K., Moheimani, S.O.R.: ‘Reducing cross-coupling in a compliant XY nanopositioner for fast and accurate raster scanning’, IEEE Trans. Control Syst. Technol., 2010, 18, (5), pp. 1172–1179 (doi: 10.1109/TCST.2009.2033201).
-
4)
-
6. Cheng, X., Krogh, B. H.: ‘Stability-constrained model predictive control’, IEEE Trans. Autom. Control, 2001, 46, (11), pp. 1816–1820 (doi: 10.1109/9.964698).
-
5)
-
3. Kenton, B.J., Fleming, A.J., Leang Kam, K.: ‘Compact ultra-fast vertical nanopositioner for improving scanning probe microscope scan speed’, Rev. Sci. Instrum., 2011, 82, (12), pp. 123703–123703–8 (doi: 10.1063/1.3664613).
-
6)
-
4. Wadikhaye, S.P., Yong, Y.K., Moheimani, S.O.R.: ‘Design of a compact serial-kinematic scanner for high-speed atomic force microscopy: an analytical approach’, IET Micro Nano Lett., 2012, 7, (4), pp. 309–313 (doi: 10.1049/mnl.2011.0477).
-
7)
-
2. Chih-Lieh, C., Jim-Wei, W., Yi-Ting, L., et al: ‘Precision sinusoidal local scan for large-range atomic force microscopy with auxiliary optical microscopy’, IEEE/ASME Trans. Mechatronics, 2014, 20, (1), pp. 226–236.
http://iet.metastore.ingenta.com/content/journals/10.1049/mnl.2019.0334
Related content
content/journals/10.1049/mnl.2019.0334
pub_keyword,iet_inspecKeyword,pub_concept
6
6