Synthesis and X-ray responsivity of Zn0.75Cd0.25Te nanoribbons

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Synthesis and X-ray responsivity of Zn0.75Cd0.25Te nanoribbons

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To reduce the size and to lower energy consumption are very important for the portable X-ray detector. It is clear that the nanodetector based on nanotechnology will be the future trend. The single-crystalline Zn0.75Cd0.25Te nanoribbons are synthesised by a two-step process, and the X-ray detectors from individual nanoribbon are fabricated. The X-ray detecting performances are carried out by using three kinds of X-ray source with different energy of 8.857, 9.659 and 11.564 KeV, respectively. The nanodetectors exhibit a high sensitivity, fast response speed, which are attributed to the high-aspect ratio, nearly perfect single-crystalline quality and the reduction of the recombination barrier in the ribbon. The remarkable X-ray responsivity implies that the Zn0.75Cd0.25Te nanoribbons are a very attractive candidate for application in X-ray nanodetectors at room temperature.

Inspec keywords: zinc compounds; crystal growth from solution; wide band gap semiconductors; nanosensors; nanostructured materials; crystal structure; cadmium compounds; semiconductor growth; II-VI semiconductors; X-ray detection; semiconductor devices; nanofabrication

Other keywords: electron volt energy 9.659 keV; Zn0.75Cd0.25Te; recombination barrier; nanodetector; crystal structure; electron volt energy 8.857 keV; X-ray responsivity; portable X-ray detector; energy consumption; single-crystalline nanoribbons; nanotechnology; electron volt energy 11.564 keV

Subjects: Structure of solid clusters, nanoparticles, nanotubes and nanostructured materials; Methods of nanofabrication and processing; Microsensors and nanosensors; Crystal structure of specific inorganic compounds; II-VI and III-V semiconductors; Crystal growth; Sensing and detecting devices; Nanometre-scale semiconductor fabrication technology; Crystal growth from solution

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      • S. Tokuda , H. Kishihara , S. Adachi , T. Sato . Preparation and characterization of polycrystalline CdZnTe films for large-area, high-sensitivity X-ray detectors. J. Mater. Sci. Mater. , 1 , 1 - 8
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