access icon openaccess FPGA-based fault injection design for 16K-point FFT processor

This is an open access article published by the IET under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0/)
Received 25/02/2019, Accepted 02/05/2019, Published 13/08/2019
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Inspec keywords: integrated circuit design; VLSI; space vehicle electronics; radiation hardening (electronics); integrated circuit reliability; SRAM chips; fast Fourier transforms; integrated circuit testing; field programmable gate arrays; microprocessor chips

Other keywords: 16K-point fast Fourier transformation processor; very-large-scale integration circuits; memory devices; reliability evaluation; soft error mitigation controller; FPGA-based fault injection design; design under test; transformation processor; field programmable gate arrays; fault injection method; satellites; DUT; electron devices; resource consumption; permanent damage; hardware circuits; reliability testing techniques; Golden data; 16K-point FFT processor; SRAM

Subjects: Integral transforms; Logic circuits; Microprocessor chips; Semiconductor storage; Digital circuit design, modelling and testing; Integral transforms; Memory circuits; Reliability; Space vehicle electronics; Logic and switching circuits; Microprocessors and microcomputers; Radiation effects (semiconductor technology)

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