This is an open access article published by the IET under the Creative Commons Attribution License (http://creativecommons.org/licenses/by/3.0/)
Since the German physicist Roentgen discovered X-rays, X-rays have been widely used in medical diagnostics, industrial non-destructive testing, and scientific research. There are four main types of single-energy X-ray generation: k-fluorescence, radioactive sources, X-ray machines (relying on monochromators), and synchrotron radiation. In view of the advantages of using X-ray machines to generate continuous energy points and non-nuclear pollution, this study uses Oxford fluorescent tubes and crystal diffraction methods to generate single-energy X-rays. The diffracted crystal uses Si111 and calculates the different energy values obtained by diffracting different Bragg angles. This study uses the silicon drift detector to measure the energy spectrum of (6–15) keV single-energy X-rays, the stability of the Oxford fluorescent tube, and spot size with a charge-coupled device detector. The obtained energy spectrum is compared with the theoretical energy calculated to verify the correctness of this method and provides important reference for crystal diffraction in low-energy sections.
References
-
-
1)
-
8. Shao, X., Deng, Y.R., Ma, Y., et al: ‘Structure, principle and application of X-ray tube’, J. Shenyang Normal Univ., 2012, 30, (3), pp. 354–359.
-
2)
-
3. Lu, F.J.: ‘Exploration technologies and scientific operation of hard X-ray modulation telescope’, .
-
3)
-
11. Gatti, E., Rehak, P.: ‘The concept of a solid state drift chamber’, .
-
4)
-
13. Leutenegger, P., Longoni, A., Fiorini, C., et al: ‘Works of art investigation with silicon drift detectors’, Nucl. Instrum. Methods Phys.Res. A, 2000, 439, pp. 458–470.
-
5)
-
12. Gatti, E., Rehak, P.: ‘Semiconductor drift chamber – an application of a novel charge transport scheme’, Nucl. Instrum. Methods, 1984, 225, pp. 608–614.
-
6)
-
4. Zhou, X.: ‘Development of the ground calibration facility and study of the calibration method for the hard X-ray detectors on board HXMT’ (University of Chinese Academy of Sciences, Beijing, 2015).
-
7)
-
15. Zhu, Y., Zhang, Z. L., Yang, Y. J., et al: ‘Quantum efficiency calibration for low energy detector on board hard X-ray modulation telescope satellite’, Acta Phys. Sin., 2017, pp. 51–53.
-
8)
-
5. Wang, J., Kang, X., Wu, J.J.: ‘The measurement and research of (10–200) keV monoenergetic X-rays’ (University of South China, Hengyang, 2016).
-
9)
-
16. Wu, J.J., Wang, P.W., Duan, X.J., et al: ‘The establishment of radiation primary standard in the range of low energy X-rays’, Acta Metrologica Sin., 2011, 32, (z1), pp. 9–13.
-
10)
-
10. Lu, H.M., Zhao, Y., Ye, Z.Z.: ‘Principle and applications of high resolution double-crystal X-ray diffractometer’, Mater. Sci. Eng., 1997, (S4), pp. 1673–2812.
-
11)
-
1. Frankel, R.I.: ‘Centennial of Rontgen's discovery of X-rays’, West. J. Med., 1996, 164, (6), pp. 497–501.
-
12)
-
6. Lin, S. K.: ‘Research progress of soft X-ray analysing crystals’, J. Synth. Cryst., 2012, (S1), pp. 204–209.
-
13)
-
7. Li, C.Z., Wu, J.J., Peng, A.G., et al: ‘Study on the property of high energy X-ray facility’, Nucl. Electron. Detect. Technol., 2017, pp. 569–574.
-
14)
-
2. Zhou, H.S., Luo, J.H., Ma, G., et al: ‘The foundation of quasi-mono-energy continuous hard X-ray unit’, Nucl. Electron. Detect. Technol., 2015, 35, , (9), pp. 60–64.
-
15)
-
14. Hansen, K., Reckleben, C., Diehl, I., et al: ‘Electrical and spectroscopic characterization of 7 cell Si-drift detectors’, Nucl. Instrum. Methods Phys. Res. A, 2008, 585, pp. 76–82.
-
16)
-
9. Wang, H., Liao, C.J., Fan, G.H.: ‘The development and application of the X-ray double crystal diffraction technology’, Coll. Phys., 2001, 20, (7), pp. 30–35.
http://iet.metastore.ingenta.com/content/journals/10.1049/joe.2018.9079
Related content
content/journals/10.1049/joe.2018.9079
pub_keyword,iet_inspecKeyword,pub_concept
6
6