Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

access icon openaccess Particle swarm optimisation driven low cost single event transient fault secured design during architectural synthesis

Owing to aggressive shrinking in nanometre scale as well as faster devices, particle strike manifesting itself into transient fault spanning multiple cycle and multiple units will be the centre-focus of application specific datapath generated through high-level synthesis (HLS)/architectural synthesis. Addressing each problem above separately leads to large area/delay overhead; thus tackling both problems concurrently, leads to huge incurred overhead. To tackle this complex problem, this paper proposes a novel low cost particle swarm optimisation driven dual modular redundant (DMR) based HLS methodology for generation of a transient fault secured design secured against its temporal and spatial effects. The authors' approach provides a low cost optimised fault secured solution through a particle swarm optimisation exploration framework based on user area-delay constraints. Results indicated that proposed approach obtains an area overhead reduction of 34.08% and latency overhead reduction of 5.8% compared with a recent approach.

References

    1. 1)
    2. 2)
      • 20. Pignol, M.: ‘How to cope with SEU/SET at system level?’. 11th IEEE Int. in On-Line Testing Symp., July 2005, pp. 315318.
    3. 3)
    4. 4)
      • 34. Engelbrecht, A.P.: ‘Fundamental of computational swarm intelligence’ (John Wiley and sons limited, England, 2005).
    5. 5)
    6. 6)
      • 13. Rossi, D., Omana, M., Toma, F., et al: ‘Multiple transient faults in logic: an issue for next generation ICs?’. 20th IEEE Int. Symp on Defect and Fault Tolerance in VLSI Systems, 2005, pp. 352360.
    7. 7)
      • 23. Fazeli, M., Ahmadian, S.N., Miremadi, S.G., et al: ‘Soft error rate estimation of digital circuits in the presence of multiple event transients (METs)’. Design, Automation and Test in Europe Conf. and Exhibition (DATE), 2011, pp. 16.
    8. 8)
      • 36. Dubrova, E.: ‘Fault-tolerant design’ (Springer, New York, USA, 2013), ISBN 978-1-4614-2112-2.
    9. 9)
      • 30. Eberhart, R.C., Shi, Y.: ‘Particle swarm optimization: developments, applications and resources’. Proc. of the 2001 Congress on Evolutionary Computation, May 2001, pp. 8186.
    10. 10)
      • 21. Mizan, E., Amimeur, T., Jacome, M.F.: ‘Self-imposed temporal redundancy: An efficient technique to enhance the reliability of pipelined functional units’. IEEE 19th Int. Symp. on Computer Architecture and High Performance Computing, 2007, pp. 4553.
    11. 11)
      • 32. Sengupta, A., Mishra, V.K.: ‘Integrated particle swarm optimization (i-PSO): an adaptive design space exploration framework for power-performance tradeoff in architectural synthesis’. Proc. of IEEE 15th Int. Symp. on Quality Electronic Design (ISQED 2014), California, USA, March 2014, pp. 6067.
    12. 12)
    13. 13)
      • 17. Mukherjee, S.S., Emer, J., Reinhardt, S.K.: ‘The soft error problem: an architectural perspective’. 11th Int. Symp. on High-Performance Computer Architecture, February 2005, pp. 243247.
    14. 14)
    15. 15)
      • 25. Inoue, T., Henmi, H., Yoshikawa, Y., et al: ‘High-level synthesis for multi-cycle transient fault tolerant datapaths’. Proc. of the 17th IEEE Int. On-Line Testing Symp., 2011, pp. 1318.
    16. 16)
    17. 17)
    18. 18)
      • 38. Hu, J., Lienig, J., Markov, I.L., et al: ‘VLSI physical design: from graph partitioning to timing closure’ (Springer, Netherlands, 2011), ISBN 978-90-481-9591-6.
    19. 19)
      • 12. Mohanty, S.P., Ranganathan, N., Kougianos, E., et al: ‘Low-power high-level synthesis for nanoscale CMOS circuits’ (Springer, 2008), pp. 540.
    20. 20)
      • 29. Kennedy, J., Eberhart, R.C.: ‘Particle swarm optimization’. Proc. of the 1995 IEEE Int. Conf. on Neural Networks, 1995, pp. 19421948.
    21. 21)
      • 27. Wu, K., Karri, R.: ‘Algorithm level recomputing—a register transfer level concurrent error detection technique’. Proc. IEEE/ACM Int. Conf. Computer-Aided Design, November 2001, pp. 537543.
    22. 22)
      • 37. Sait, S., Youssef, H.: ‘VLSI physical design automation: theory and practice’, (World Scientific Publishing Company, 1999), pp. 91152.
    23. 23)
    24. 24)
      • 4. radhome.gsfc.nasa.gov/radhome/see.htm, 2015.
    25. 25)
      • 8. Lisboa, C.A., Carro, L.: ‘System level approaches for mitigation of long duration transient faults in future technologies’. 12th IEEE European Test Symp. – ETS 2007, 20–24 May 2007, pp. 165172.
    26. 26)
    27. 27)
      • 16. Polian, I., Hayes, J.P., Kundu, S., et al: ‘Transient fault characterization in dynamic noisy environments’. Test Conf., 2005. Proc. ITC 2005. IEEE Int., November 2005, vol., no., pp. 101048.
    28. 28)
    29. 29)
    30. 30)
      • 35. Express high level synthesis benchmark, University of California Santa Barbara. Available at http://express.ece.ucsb.edu/benchmark/, December 2015.
    31. 31)
      • 19. Gomaa, M., Vijaykumar, T.N.: ‘Opportunistic transient-fault detection’. Proc. 32nd Int. Symp. on Computer Architecture, ISCA'05, June 2005.
    32. 32)
      • 11. Rusu, C., Bougerol, A., Anghel, L., et al: ‘Multiple event transient induced by nuclear reactions in CMOS logic cells’. 13th IEEE Int. On-Line Testing Symp., July 2007, pp. 137145.
    33. 33)
      • 3. Benini, L., Micheli, G.D.: ‘The data-link layer in NoC design’, in Benini, L., De Micheli, G. (Eds.): ‘Networks on Chips’ (Morgan Kaufmann, San Francisco, 2006).
    34. 34)
    35. 35)
    36. 36)
      • 7. Kumar, S., Agarwal, S., Jung, J.P., et al: ‘Soft error issue and importance of low alpha solders for microelectronics packaging’, Rev. Adv. Mater. Sci., 2013, 34, pp. 185202.
    37. 37)
    38. 38)
      • 15. Lala, P.K.: ‘Fault-tolerant and fault-testable hardware design’ (Prentice-Hall, Inc., Upper Saddle River, NJ, USA, 1985).
http://iet.metastore.ingenta.com/content/journals/10.1049/joe.2016.0378
Loading

Related content

content/journals/10.1049/joe.2016.0378
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address