This is an open access article published by the IET under the Creative Commons Attribution-NonCommercial-NoDerivs License (http://creativecommons.org/licenses/by-nc-nd/3.0/)
An algorithm for the de-noising of S-parameter data used in microwave imaging is proposed. The complex S-parameter frequency-sweep data are collected through scans over an acquisition surface and the algorithm separates efficiently the resulting two-dimensional responses (one frequency at a time) into a signal and a noise component. The separation is performed with an iterative procedure similar to the empirical mode decomposition. The signal component estimates the noise-free data, whereas the remaining data content estimates the noise and uncertainty in the measurement. The algorithm performance is verified with measured data.
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