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access icon openaccess Polarisation analysing complementary metal-oxide semiconductor image sensor in 65-nm standard CMOS technology

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References

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      • 8. Wakama, N., Matsuoka, H., Ando, K., et al: ‘A polarisation analysing CMOS image sensor with metal wire grid in 65-nm standard CMOS technology’. Proc. Int. Meeting for Future of Electron Devices Kansai, May 2012, pp. 130131, doi: 10.1109/IMFEDK.2012.6218616.
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      • 10. Ohta, J.: ‘Smart CMOS image sensors and applications’ (CRC Press, 2007).
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