They come from outer space

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They come from outer space

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Published

Today, a system using hundreds of chips could suffer several soft error failures a month, and the problem is set to increase. Why is this and what are the implications?

Inspec keywords: integrated circuit reliability; radiation effects; failure analysis; cosmic ray interactions

Other keywords: outer space; radiation effects; soft error failures; chips; integrated circuit reliability; cosmic ray interactions

Subjects: Maintenance and reliability; Radiation effects (semiconductor technology); Reliability

http://iet.metastore.ingenta.com/content/journals/10.1049/ir_20030805
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