http://iet.metastore.ingenta.com
1887

Traceable high-precision impedance measurements for the millimetre-wave band using dielectric waveguide transmission lines

Traceable high-precision impedance measurements for the millimetre-wave band using dielectric waveguide transmission lines

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
IEE Proceedings - Science, Measurement and Technology — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

Currently, the UK's national standards for impedance measurements are only available for frequencies up to 50 GHz in a coaxial line and 110 GHz in a metallic rectangular waveguide. No standards exist above these frequencies. A need to provide measurement standards and measurement assurance above these frequencies has led to research into a new form of impedance standard for precision metrology applications across the entire millimetre-wave band and perhaps beyond (i.e. extending to at least 300 GHz). We report the development of the new standards and other devices that utilise a dielectric waveguide as the transmission medium, and we show how these standards can be used to calibrate measuring instruments, such as vector network analysers (VNAs), and to provide traceability to national standards.

References

    1. 1)
      • H.H. Meinel . Commercial applications of millimeterwaves – history, present status, and future trends. IEEE Trans. , 7 , 1639 - 1653
    2. 2)
    3. 3)
      • T. Newman . Millimeter-wave satellite remote sensing. Microw. J. , 8 , 22 - 48
    4. 4)
      • IEEE P287, ‘Draft standard for precision coaxial connectors (DC to 110 GHz)’, IEEE Instrum. Meas. Soc., 2005.
    5. 5)
      • Oleson, C., Denning, A.: `Millimeter-wave vector analysis calibration and measurement problems caused by common waveguide irregularities', 56thARFTG conference digest, November 2000, Boulder, Colorado, USA, p. 54–62.
    6. 6)
      • Collier, R.J.: `Measurements of impedance above 110 GHz', IEE Colloquium Digest no. 99/008, February 1999, p. 1/1–1/6.
    7. 7)
      • Collier, R.J., D'Sousa, M.F.: `A multistate reflectometer in dielectric guide for the frequency range 75–140 GHz', IEEE MTT-S International Microwave Symposium Digest, June 1991, Boston, Massachusetts, USA, p. 1027–1030.
    8. 8)
      • G.J. French , N.M. Ridler . A primary national standard for millimetric waveguide S-parameter measurements. Microw. Eng. Eur. , 29 - 32
    9. 9)
      • Kaye and Laby online: http://www.kayelaby.npl.co.uk. Also, www.goodfellow.com.
    10. 10)
      • Marks, R.B.: `Formulations of the basic vector network analyser error model including switch terms', 50thARFTG conference digest, Decmeber 1997, p. 115–126.
    11. 11)
      • Rytting, D.K.: `An analysis of vector measurement accuracy enhancement techniques', RF & Microwave Symposium and Exhibition, Hewlett Packard, March 1980, Santa Rosa, California, USA.
    12. 12)
      • Rytting, D.K.: `Network analyser error models and calibration methods', NIST/ARFTG Short Course on Microwave Measurements for Digital Communication Systems, December 2004, Orlando, Florida, USA, Available from www.arftg.org.
    13. 13)
      • A.G. Morgan , N.M. Ridler , M.J. Salter . Generalized adaptive calibration schemes for precision RF network analyser measurements. IEEE Trans. , 4 , 1266 - 1272
    14. 14)
      • Salter, M.J., Ridler, N.M., Harris, P.M.: `Over-determined calibration schemes for RF network analysers employing generalised distance regression', 62ndAutomatic RF Techniques Group (ARFTG) Conf., December 2003, Boulder, CO, USA, p. 127–142.
    15. 15)
      • G.F. Engen , C.A. Hoer . Thru-Reflect-Line: an improved technique for calibrating the dual six-port automatic network analyser. IEEE Trans. , 12 , 987 - 993
    16. 16)
      • C.A. Hoer , G.F. Engen . On-line accuracy assessment for the dual six-port ANA: extension to nonmating connectors. IEEE Trans. , 2 , 524 - 529
    17. 17)
      • Eul, H.J., Schiek, B.: `Thru-Match-Reflect: one result of a rigorous theory for de-embedding and network analyser calibration', Proc. 18th European Microwave Conf., September 1988, p. 909–914.
    18. 18)
      • H.J. Eul , B. Schiek . A generalized theory and new calibration procedures for network analyser self-calibration. IEEE Trans. , 724 - 731
    19. 19)
      • R.J. Collier , M.F. D'Souza . Comparison of junctions in both dielectric guides and metallic guides above 75 GHz. IEE Proc. A , 5 , 226 - 228
    20. 20)
      • Bannister, D.J., Griffin, E.J., Hodgetts, T.E.: `On the dimensional tolerances of rectangular waveguide for reflectometry at millimetric wavelengths', NPL Report DES 95, September 1989.
    21. 21)
      • (1993) ISO: ‘Guide to the expression of uncertainty in measurement’.
    22. 22)
      • Ridler, N.M., Medley, J.C.: `An uncertainty budget for VHF and UHF reflectometers', NPL Report DES 120, May 1992.
    23. 23)
      • Young, P.R.: `Propagation of uncertainty in one-port ANA measurements', ANAMET Report 017, August 1998, Available from www.npl.co.uk/anamet..
http://iet.metastore.ingenta.com/content/journals/10.1049/ip-smt_20050095
Loading

Related content

content/journals/10.1049/ip-smt_20050095
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address