Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements
Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements
- Author(s): P.R. Young ; D.S. McPherson ; C. Chrisostomidis ; K. Elgaid ; I.G. Thayne ; S. Lucyszyn ; I.D. Robertson
- DOI: 10.1049/ip-map:20010402
For access to this article, please select a purchase option:
Buy article PDF
Buy Knowledge Pack
IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.
Thank you
Your recommendation has been sent to your librarian.
- Author(s): P.R. Young 1 ; D.S. McPherson 2 ; C. Chrisostomidis 2 ; K. Elgaid 3 ; I.G. Thayne 3 ; S. Lucyszyn 4 ; I.D. Robertson 2
-
-
View affiliations
-
Affiliations:
1: Electronic Engineering Laboratory, University of Kent at Canterbury, Canterbury, United Kingdom
2: School of Electronic Engineering, Information Technology and Mathematics, University of Surrey, Guildford, United Kingdom
3: Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow, United Kingdom
4: Department of Electrical and Electronic Engineering, Imperial College, London, United Kingdom
-
Affiliations:
1: Electronic Engineering Laboratory, University of Kent at Canterbury, Canterbury, United Kingdom
- Source:
Volume 148, Issue 3,
June 2001,
p.
153 – 156
DOI: 10.1049/ip-map:20010402 , Print ISSN 1350-2417, Online ISSN 1359-706X
An accurate model for lossy non-uniform transmission lines is presented. The technique provides a coplanar waveguide (CPW) taper model, which has been used to accurately de-embed measurements of passive CPW components in line geometries differing from the nominal 50 Ω geometry of the calibration. The model accounts for both dielectric and conductor losses, and is shown to be in excellent agreement with measured results from 45 MHz to 120 GHz.
Inspec keywords: transmission line theory; integrated circuit measurement; MMIC; coplanar waveguides; S-parameters
Other keywords: conductor losses; accurate model; S-parameters; on-wafer measurements de-embedding; nonuniform transmission line model; 45 MHz to 120 GHz; coplanar waveguide taper model; lossy nonuniform transmission lines; passive CPW components; dielectric losses
Subjects: Semiconductor integrated circuits; Transmission line theory; Microwave integrated circuits
References
-
-
1)
- R. Marks , D. Williams . Characteristic impedance determination usingpropagation constant measurement. IEEE Microw. Guid. Wave Lett. , 6 , 141 - 143
-
2)
- R. Marks , D. Williams . A general waveguide circuit theory. J. Res. Natl. Inst. Stand. Technol. , 533 - 562
-
3)
- M. Boas . (1983) Mathematical methods in the physical sciences.
-
4)
- R. Marks , D. Williams . Transmission line capacitance measurement. IEEE Microw. Guid. Wave Lett. , 9 , 243 - 245
-
5)
- W. Heinrich . Quasi-TEM description of MMIC coplanar lines including-loss effects. IEEE Trans. Microw. Theory Tech. , 45 - 52
-
6)
- R. Marks . A multiline method of network analyser calibration. IEEE Trans. Microw. Theory Tech. , 7 , 1205 - 121
-
7)
- D. Kuznetsov . Efficient circuit simulation of nonuniform transmission lines. IEEE Trans. Microw. Theory Tech. , 5 , 546 - 550
-
8)
- M. Le Roy , A. Perennec , S. Toutain , L. Calvez . The continuously varying transmission-line technique – applicationto filter design. IEEE Trans. Microw. Theory Tech. , 9 , 1680 - 1687
-
9)
- E.N. Protonotarios , O. Wing . Analysis and intrinsic properties of the general nonuniform transmission line. IEEE Trans. Microw. Theory Tech. , 3 , 142 - 150
-
10)
- T.W. Pan , C.W. Hsue . Modified transmission and reflection coefficients ofnonuniform transmission lines and their applications. IEEE Trans. Microw. Theory Tech. , 12 , 2092 - 2097
-
11)
- T. Sporkmann . The current state of the art in coplanar MMICs. Microw. J. , 8 , 60 - 74
-
12)
- N. Boulejfen , A.B. Kouki , F.M. Ghannouchi . A robust and efficient method for the frequency domain analysis of non-uniformlossy multi-linetransmission structures. IEEE MTT-S Int. Microw. Symp. Dig. , 1763 - 1766
-
13)
- A.H. Hamade , A.B. Kouki , F.M. Ghannouchi . A CAD-suitableapproach for the analysis of nonuniform MMIC and MHMIC transmission lines. IEEE Trans. Microw. Theory Tech. , 9 , 1614 - 1617
-
14)
- W.H. Press , S.A. Teukolsky , W.T. Vetterling , B.P. Flannery . (1992) Numerical recipes.
-
1)
Related content
