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Transient response of p-n junction solar cells under constant illumination is studied by applying a reverse voltage pulse. It is shown that, by a proper choice of current in the external circuit, results similar to those in open-circuit voltage-decay method or reverse-voltage recovery method could be obtained. Thus an extremely simple circuit allows lifetime determination by keeping the cell under normal illuminated conditions.
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http://iet.metastore.ingenta.com/content/journals/10.1049/ip-i-1.1980.0004
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