Cellular automata based pattern generator for testing RAM

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Cellular automata based pattern generator for testing RAM

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© The Institution of Electrical Engineers
Published

The paper presents a new strategy for parallel testing of RAM. A cellular automata (CA) based test pattern generator for detecting pattern sensitive faults (PSFs) in random access memories is also reported. An 8-cell one dimensional three neighbourhood CA has been extended to the five-neighbourhood case preserving the criterion of local connections. By changing the neighbourhood relation, all the 64 patterns for detecting five-neighbourhood PSFs can be generated by loading two seeds only. The method can be easily extended for detecting PSFs of any neighbourhood.

Inspec keywords: cellular automata; logic testing; random-access storage

Other keywords: pattern sensitive faults; RAM; parallel testing; cellular automata; test pattern generator

Subjects: Logic design methods; Automata theory; Semiconductor storage

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