Memory testing by linear checks
Memory testing by linear checks
- Author(s): M. Karpovsky
- DOI: 10.1049/ip-e.1984.0033
For access to this article, please select a purchase option:
Buy article PDF
Buy Knowledge Pack
IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.
Thank you
Your recommendation has been sent to your librarian.
- Author(s): M. Karpovsky 1
-
-
View affiliations
-
Affiliations:
1: System and Electrical Engineering, College of Engineering, Department of Computers, Boston University, Boston, USA
-
Affiliations:
1: System and Electrical Engineering, College of Engineering, Department of Computers, Boston University, Boston, USA
- Source:
Volume 131, Issue 5,
September 1984,
p.
158 – 168
DOI: 10.1049/ip-e.1984.0033 , Print ISSN 0143-7062, Online ISSN 2053-7948
In this paper we consider methods of error detection, location or correction in ROM or RAM by systems of orthogonal linear equality and inequality checks and by the Rademacher transform. Implementations and error detecting, locating, correcting capabilities of these techniques for ROM and RAM testing are also described.
Inspec keywords: error detection; read-only storage; error correction; random-access storage
Other keywords:
Subjects: Memory circuits; Semiconductor storage
References
-
-
1)
- M. Karpovsky . Detection and location of errors by linear inequality checks. IEE Proc. E, Comput. & Digital Tech. , 3 , 86 - 92
-
2)
- M. Karpovsky , E. Trachtenberg . Fourier transforms over finite groups for error detection and error correction in computation channels. Inf. & Control , 335 - 358
-
3)
- Beaston, J., Domenik, S., Richardson, W.: `Development of a testing strategy for a 16 kilobit RAM', Proc. 1976 Semiconductor Test Conference, 1977, p. 1–2.
-
4)
- M.A. Breuer , A.D. Friedman . (1976) , Diagnosis and reliable design of digital systems.
-
5)
- N. Goel , M. Karpovsky . Functional testing of computer hardware based on minimising the magnitude of undetected errors. IEE Proc. E, Comput & Digital Tech. , 5 , 169 - 181
-
6)
- Redinbo, R.: `Noise analysis of soft errors in combinational digital circuits', Proc. of 1980 IEEE Int. Symposium on Electromagnetic Compatibility, 1980, Baltimore, p. 307–312.
-
7)
- Sahani, R.M.: `Reliability of integrated circuits', Proc. IEEE int. Comput. Group Conf., June 1970., Washington, D.C., p. 213–219.
-
8)
- M. Karpovsky , E. Trachtenberg . Linear checking equations and error-correcting capability for computation channels. Proc. IFIP Congress
-
9)
- M.Y. Hsiao . Store address generator with on-line fault detection capability. IEEE Trans. , 1144 - 1147
-
10)
- D.K. Pradhan . A new class of error-correcting/detecting codes for fault-tolerant computer applications. IEEE Trans. , 471 - 481
-
11)
- Cocking, J.: `RAM test pattern and test strategy', Proc. 1975 semiconductor test conference, 1977, p. 1–8.
-
12)
- M. Karpovsky . On weight distribution for binary linear codes. IEEE Trans. , 105 - 109
-
13)
- W.G. Fee . Memory testing–Tutorial on LSI testing. IEEE Comput. , 81 - 88
-
14)
- H.W. Gschwind . (1967) , Design of digital computers.
-
15)
- M. Karpovsky . Weight distributions of translates, covering radius and perfect codes correcting errors of the given weights. IEEE Trans. , 462 - 472
-
16)
- L.A. Lyusternik , D.A. Chezvonenkiz , A.R. Yampolskii . (1965) , Handbook for computing elementary functions.
-
17)
- M. Karpovsky . Testing for numerical computations. IEE Proc. E, Comput. & Digital Tech. , 2 , 69 - 76
-
18)
- R. Nair , S.M. Thatte , J.A. Abraham . Efficient algorithms for testing semiconductor random-access memories. IEEE Trans. , 572 - 576
-
19)
- M. Karpovsky . Error detection for polynomial computations. IEE J. Comput. Digital Tech. , 49 - 56
-
20)
- D.S. Suk , S.M. Reddy . A march test for functional faults in semiconductor random access memories. IEEE Trans. , 982 - 985
-
21)
- M. Karpovsky . Error detection in digital devices and computer programs with the aid of linear recurrent equations over finite commutative groups. IEEE Trans. , 208 - 219
-
22)
- M. Karpovsky . (1976) , Finite orthogonal series in the design of digital devices.
-
23)
- J.P. Hayes . Detection of pattern-sensitive faults in random-access memories. IEEE Trans. , 150 - 157
-
1)