Bottom-up approach in automated embedded memory model generation for high-performance microprocessors

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Bottom-up approach in automated embedded memory model generation for high-performance microprocessors

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In modern high-performance microprocessors, embedded memories account for approximately half the area and more than 50% of the transistors. Because of their ubiquitous nature, modelling memories remain an immensely important part of the design methodology. Adding to the challenge of memory modelling is a complication that arises from the requirement that the memories need to be modelled for each individual debug methodology – testing, formal verification, validation, emulation and so on. A tool (MemGen) that automates generation of all memory models required by testing, verification, and emulation methodologies is described. MemGen is a robust pivot of our overall design methodology, and is currently in routine use in all live design projects in Freescale Semiconductor's high-performance design centre. Results obtained from using MemGen-generated embedded memories in real-life design projects of Freescale G2 and G4 microprocessors have been presented.

Inspec keywords: microprocessor chips; integrated circuit testing; integrated circuit modelling; embedded systems; circuit CAD; integrated memory circuits

Other keywords: high-performance microprocessors; memory modeling; model testing; bottom-up automated embedded memory model generation; model emulation; model verification

Subjects: Microprocessor chips; Digital circuit design, modelling and testing; Computer-aided circuit analysis and design; Electronic engineering computing; Microprocessors and microcomputers; Semiconductor storage; Memory circuits

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