http://iet.metastore.ingenta.com
1887

Approach to partial discharge development in closely coupled cavities embedded in solid dielectrics by the lumped capacitance model

Approach to partial discharge development in closely coupled cavities embedded in solid dielectrics by the lumped capacitance model

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
IEE Proceedings A (Science, Measurement and Technology) — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

The use of the typical ABC equivalent circuit for one cavity in solid dielectrics for internal partial discharge modelling has been common practice for many years. The introduction of an equivalent circuit for two closely coupled cavities permits the investigation of the interaction between discharges in such cavities in a solid dielectric when it is stressed by high AC voltages. In this model circuit, cavities and solid dielectric parts are represented as lumped capacitances, while the resistance and the inductance of the test voltage source are taken into consideration. By using a version of the Electromagnetic Transients Program (EMTP), the waveforms of the voltage across the two cavities, as well as those of the voltage across the neighbouring parts of the solid dielectric, have been traced, and the transient voltage stressing of these parts has been analysed for repetitive discharges in the two cavities.

References

    1. 1)
      • J.H. Mason . Deterioration and breakdown of dielectrics resulting from internal discharges. Proc. IEE , 44 - 59
    2. 2)
      • R. Bartnikas , E.J. McMahon . (1979) , Engineering dielectrics-corona measurement and interpretation.
    3. 3)
      • A. Gemant , W. von Philipoff . Die Funkenstrecke mit Vorkondensator. Zeitschrift für Technische Physik , 425 - 430
    4. 4)
      • S. Whitehead . (1953) , Dielectric breakdown of solids.
    5. 5)
      • F.C. Hall , R.M. Russek . Discharge inception and extintion in dielectric voids. Proc. IEE , 781 - 787
    6. 6)
      • P.H.F. Morshuis , F.H. Kreuger , P.P. Leufkens . The effect of different types of inclusions on PE cable life. IEEE Trans. , 1051 - 1055
    7. 7)
      • G.C. Crichton , P.W. Karlsson , A. Pedersen . Partial discharges in ellipsoidal and spheroidal voids. IEEE Trans. , 335 - 340
    8. 8)
      • G. Robinson . Discharges in asymmetric cavities under AC stresses. Proc. IEE , 119 - 126
    9. 9)
      • G. Mitra , B. Salvage . Electric stress in a circular cylindrical gaseous cavity in a solid dielectric, the axis of the cylinder being parallel to the field. Proc. IEE , 931 - 935
    10. 10)
      • T. Tanaka , Y. Ikeda . Internal discharges in polyethylene with an artificial cavity. IEEE Trans. , 2692 - 2702
    11. 11)
      • D.D. Chang , T.S. Sudarshan , J.E. Thompson . Analysis of electric stress distribution in cavities embedded within dielectric structures. IEEE Trans. , 213 - 219
    12. 12)
      • M. Hikita , K. Yamada , A. Nakamura , T. Mizurani , A. Oohasi , M. Ieda . Measurements of partial discharges by computer and analysis of partial discharge distribution by the Monte Carlo method. IEEE Trans. , 453 - 468
    13. 13)
      • H.W. Dommel . Digital computer solution of electromagnetic transients in single-and multi-phase networks. IEEE Trans. , 388 - 395
    14. 14)
      • (1989) , ATP rule book.
http://iet.metastore.ingenta.com/content/journals/10.1049/ip-a-3.1993.0021
Loading

Related content

content/journals/10.1049/ip-a-3.1993.0021
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address