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Statistical process control in PCB manufacture: what are the lessons?

Statistical process control in PCB manufacture: what are the lessons?

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A number of printed circuit board (PCB) manufacturers perceive that they face difficulties in the application of statistical process control (SPC). The difficulties include the product characteristics and process parameters to be measured and charted, the mix of different manufacturing technologies, the inherent variability of the chemistry used in the process, the interconnecting nature of the processes, small batch production runs, and the concept of performance-based charts. This paper reports and examines the most common queries raised by representatives of the industry under the broad headings of: application, type of control chart and its design, interpretation, and capability.

References

    1. 1)
      • J. McHugh , B.G. Dale . (1989) , From quality circles to total quality management at Prestwick Circuits Ltd..
    2. 2)
      • M.M. Manson , B.G. Dale . The role of SPC in printed circuit board manufacture. Qual. & Reliability Eng. Int. , 165 - 173
    3. 3)
      • B.G. Dale . Japanese manufacturing efficiency: a study in the electronics industry. IEE Proc. , 5 , 293 - 301
    4. 4)
      • (1987) , Quality systems.
    5. 5)
      • J.M. Juran . (1988) , Quality control handbook.
    6. 6)
      • (1980) , Guide to number-defective charts for quality control.
    7. 7)
      • Anon . (1985) , Statistical process control course notes.
    8. 8)
      • S. Shingo . (1986) , Zero quality control: source inspection and the Poka-Yoke system.
    9. 9)
      • J.S. Oakland , R.F. Followell . (1990) , Statistical process control.
    10. 10)
      • R. Caulcutt . (1991) , Statistics in research and development.
    11. 11)
      • W.E. Deming . (1986) Out of the crisis, MIT Centre for Advanced Engineering Study.
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