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Cryogenic current comparators and their application to electrical metrology

Cryogenic current comparators and their application to electrical metrology

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© The Institution of Engineering and Technology
Published

The cryogenic current comparator (CCC), first demonstrated nearly 40 years ago, has become a key component of electrical metrology. It utilises a superconducting screen to achieve very high ratio accuracy and hence has found many applications where the electrical units need to be scaled over decade values. It has been deployed over a wide range of currents from 100 A to 1 pA and has been used to verify the accuracy of electrical quantum effects such as the quantised Hall effect. This study is a review of the theory, design principles and most common applications of the CCC. In addition to the summary of its use in top-level electrical metrology, some recent developments such as the use of high temperature superconducting materials and applications outside the realisation of electrical units are described.

Inspec keywords: Hall effect; electric current measurement; current comparators; superconducting materials; cryogenic electronics

Other keywords: cryogenic current comparators; current 100 A to 1 pA; quantised Hall effect; electrical quantum effects; superconducting materials; electrical metrology

Subjects: Superconducting junction devices; Superconducting materials; Current measurement

References

    1. 1)
    2. 2)
    3. 3)
    4. 4)
    5. 5)
    6. 6)
    7. 7)
    8. 8)
    9. 9)
    10. 10)
    11. 11)
    12. 12)
    13. 13)
    14. 14)
    15. 15)
    16. 16)
    17. 17)
    18. 18)
    19. 19)
      • Hartland, A.: `Use of a cryogenic current comparator to determine the quantized Hall resistance in a silicon MOSFET', Proc. Precision Meas. Fund. Constants II, NBS Special Publication, 1982, 617, p. 543–548.
    20. 20)
    21. 21)
    22. 22)
    23. 23)
    24. 24)
    25. 25)
    26. 26)
    27. 27)
    28. 28)
    29. 29)
    30. 30)
    31. 31)
    32. 32)
    33. 33)
    34. 34)
    35. 35)
      • A. Hartland , R.G. Jones , B.P. Kibble , D.J. Legg . The relationship between the SI ohm, the ohm at NPL and the quantized Hall resistance. IEEE Trans. Instrum. Meas. , 2 , 208 - 213
    36. 36)
    37. 37)
    38. 38)
      • G.T. Symm , C.A. Brebbia , J. Dominguez , F. Paris . (1992) Design of a cryogenic current comparator, Proc. boundary elements XIV: field problems and applications.
    39. 39)
    40. 40)
    41. 41)
    42. 42)
    43. 43)
    44. 44)
    45. 45)
    46. 46)
      • J. Gallop , F.: Piquemal , J. Clarke , A. Braginski . (2006) SQUIDs for standards and metrology, The SQUID handbook: applications of SQUIDs and SQUID systems.
    47. 47)
    48. 48)
    49. 49)
    50. 50)
    51. 51)
    52. 52)
      • K. Grohmann , D. Hechtfischer . Kryostromkomparatoren als Präzisionsstandards für rationale Gleich- und Wechselstromverhältnisse. PTB-Mitteilungen , 328 - 344
    53. 53)
    54. 54)
    55. 55)
    56. 56)
    57. 57)
    58. 58)
      • ISO/IEC Guide 98-3:2008: ‘Uncertainty of measurement – Part 3: Guide to the expression of uncertainty in measurement’ (GUM, 1995).
    59. 59)
    60. 60)
    61. 61)
    62. 62)
    63. 63)
    64. 64)
    65. 65)
    66. 66)
    67. 67)
    68. 68)
    69. 69)
    70. 70)
    71. 71)
    72. 72)
    73. 73)
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