Editorial

Author(s): GUEST EDITORS Shen Yin ¹ ; Huijun Gao ¹ ; Steven Ding ² ; Zhuo Wang ³
- Affiliations: 1: Harbin Institute of Technology, China ;
  2: University of Duisburg-Essen, Germany ;
  3: Hong Kong University of Science and Technology, Hong Kong
Source: Volume 9, Issue 7, 23 April 2015, p. 997 – 999
DOI: 10.1049/iet-cta.2014.1350 , Print ISSN 1751-8644, Online ISSN 1751-8652

Received 19/12/2014, Accepted 19/12/2014, Published

There is no abstract available for this article.