Bu, Lake; Karpovsky, Mark G.; Kinsy, Michel A.: 'Design of reliable storage and compute systems with lightweight group testing based non-binary error correction codes', IET Computers & Digital Techniques, 2019, 13, (3), p. 140-153, DOI: 10.1049/iet-cdt.2018.5008
IET Digital Library, https://digital-library.theiet.org/;jsessionid=6tk9htjsb4010.x-iet-live-01content/journals/10.1049/iet-cdt.2018.5008