access icon free HASTI: hardware-assisted functional testing of embedded processors in idle times

In the past decades, software-based self-testing (SBST) which is testing of a processing core using its native instructions has attracted much attention. However, efficient SBST of a processing core which is deeply embedded in a multicore architecture is still an open issue. In this study, inspiring from built-in self-test methods, the authors place several number of hardware test components next to the processing cores in order to overcome existing SBST challenges. These test components facilitate quick testing of embedded cores by providing several mechanisms such as virtual fetch, virtual jump, fake load & store, and segmented test application. In order to enable segmented test application, they propose the concept of test snippet and a test snippet generation approach. The result is the capability of testing embedded cores in short idle times leading to efficient online testing of the cores with zero performance overhead. The authors’ results show that their test snippet generation approach not only leads to the production of test snippets which are properly fitted the proposed test architecture but also its final fault coverage is comparable and even a little better than the fault coverage of the best existing methods.

Inspec keywords: built-in self test; embedded systems; multiprocessing systems; program testing; integrated circuit testing; microprocessor chips

Other keywords: zero performance overhead; hardware-assisted functional testing; test snippet generation approach; embedded core testing; SBST; short idle times; HASTI; embedded processors; built-in self-test methods; multicore architecture; hardware test components; efficient online testing; software-based self-testing; segmented test application; test architecture

Subjects: Microprocessors and microcomputers; Digital circuit design, modelling and testing; Microprocessor chips; Diagnostic, testing, debugging and evaluating systems; Multiprocessing systems

http://iet.metastore.ingenta.com/content/journals/10.1049/iet-cdt.2018.5003
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