Hardware errors and failures caused by radiation are becoming significant threats to a growing range of systems. Electronics manufacturers and the engineering industry have been investing more and more in research into single-event effects in recent years in order to determine the impact on system reliability today and in the future, but there is still much work to be done. For high-reliability applications, single-event effect consideration and mitigation at the design phase has become increasingly important, and with the continuing trends in technology miniaturisation, such considerations are likely to become more important in the future.
