Improved performance of 264 nm emission AlGaN-based deep ultraviolet light-emitting diodes

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Improved performance of 264 nm emission AlGaN-based deep ultraviolet light-emitting diodes

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AlGaN-based multiple-quantum-well light-emitting diodes (LEDs) with peak emission at UV-C region of 264 nm were successfully gown on AlN template using metal organic chemical vapour deposition. It was found that a subband emission around 320 nm can be drastically reduced by inserting a thin 1 nm-thick AlN interlayer between the active region and p-type layers. This is presumably a result of the suppression of electron overflow or Mg diffusion. It was also observed that the output power in LEDs was increased up to more than 20 times by changing the layer construction.

Inspec keywords: chemical vapour deposition; aluminium compounds; light emitting diodes; III-V semiconductors

Other keywords: UV-C region; Mg diffusion; peak emission; light-emitting diodes; metal organic chemical vapour deposition; p-type layers; electron overflow suppression; AlGaN-based multiple-quantum-well; emission AlGaN-based deep ultraviolet LED; AlN interlayer; subband emission; AlN template

Subjects: Light emitting diodes; II-VI and III-V semiconductors; Chemical vapour deposition

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http://iet.metastore.ingenta.com/content/journals/10.1049/el_20082753
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