Boyer, A.; Bendhia, S.; Sicard, E.: 'Characterisation of electromagnetic susceptibility of integrated circuits using near-field scan', Electronics Letters, 2007, 43, (1), p. 15-16, DOI: 10.1049/el:20073130
IET Digital Library, https://digital-library.theiet.org/;jsessionid=2hd482c0hf27v.x-iet-live-01content/journals/10.1049/el_20073130