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Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

Characterisation at infrared wavelengths of metamaterials formed by thin-film metallic split-ring resonator arrays on silicon

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The infrared reflectance spectra at normal incidence for split-ring resonator arrays fabricated in thin films of three different metals on a silicon substrate are reported. The results are compared with a finite difference time domain simulation of the structures and a simple and novel equivalent-circuit method for the calculation of the first and second resonant wavelengths.

Inspec keywords: silicon; reflectivity; optical resonators; finite difference time-domain analysis; metallic thin films; equivalent circuits; metamaterials; infrared spectra

Other keywords: FDTD; split-ring resonator arrays; infrared reflectance spectra; equivalent circuit method; finite difference time domain simulation; silicon substrate; metamaterials; normal incidence; metallic thin film; resonant wavelengths

Subjects: Optical materials; Other numerical methods

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