Proposal for solid-state particle detector based on latchup effect

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Proposal for solid-state particle detector based on latchup effect

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Published

A novel approach to detect particles by means of a solid-state device susceptible to latchup effects is described. The stimulated ignition of latchup effects caused by external radiation has so far proven to be a hidden hazard. This is proposed as a powerful means of achieving the precise detection and positioning of a broad range of particles with a spatial resolution of 5 µm.

Inspec keywords: CMOS integrated circuits; radiation effects; particle detectors

Other keywords: solid-state device; external radiation; solid-state particle detector; stimulated ignition; latchup effect

Subjects: CMOS integrated circuits; Radiation effects (semiconductor technology); Particle and radiation detection and measurement

References

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