Multi-valued static random access memory (SRAM) cell with single-electron and MOSFET hybrid circuit

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Multi-valued static random access memory (SRAM) cell with single-electron and MOSFET hybrid circuit

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A new multi-valued static random access memory (MVSRAM) cell with a hybrid circuit consisting of a single-electron (SE) and MOSFETs is proposed. The previously reported MVSRAM with an SE-MOSFET hybrid circuit needs two data lines, one bit line for write operations and one sense line for read operations, to improve the speed of the read-out operation, but the proposed cell has only one data line for read/write operations, resulting in a memory area that is much smaller than that of the previous cell, without any reduction of read-out speed.

Inspec keywords: MOSFET; single electron devices; memory architecture; random-access storage

Other keywords: read/write operations; static random access memory; data line; single-electron circuit; SE-MOSFET; memory area; MOSFET; MVSRAM; read-out speed; read-out operation; hybrid circuit

Subjects: Quantum interference devices; Insulated gate field effect transistors; Semiconductor storage; Memory circuits

References

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      • Kim, S.J., Kang, J.S., Kim, W.J., Kim, Y.J., Hur, S.M., Baek, I.B., Lee, C.K., Lee, S.D., Choi, J.B.: `Si-SET with a high Coulomb energy of 600K and its hybrid circuit with FET for a multi-valued logic cells operating 77K', 2005 Silicon Nanoelectronics Workshop, June 2005, Kyoto, Japan, p. 138–139.
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      • H. Inokawa , A. Fujiwara , Y. Takahashi . A multi-valued logic and memory with combined single-electron and metal-oxide-semiconductor transistors. IEEE Tran. Electron Devices , 2 , 462 - 470
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