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A new multi-valued static random access memory (MVSRAM) cell with a hybrid circuit consisting of a single-electron (SE) and MOSFETs is proposed. The previously reported MVSRAM with an SE-MOSFET hybrid circuit needs two data lines, one bit line for write operations and one sense line for read operations, to improve the speed of the read-out operation, but the proposed cell has only one data line for read/write operations, resulting in a memory area that is much smaller than that of the previous cell, without any reduction of read-out speed.
Inspec keywords: MOSFET; single electron devices; memory architecture; random-access storage
Other keywords:
Subjects: Quantum interference devices; Insulated gate field effect transistors; Semiconductor storage; Memory circuits