Simple material parameter estimation via terahertz time-domain spectroscopy

Simple material parameter estimation via terahertz time-domain spectroscopy

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A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 µm at a frequency of 0.1 THz or 20 µm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon.


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