RC hardened FPGA configuration SRAM cell design

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RC hardened FPGA configuration SRAM cell design

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A radiation hardened configuration bit cell design is proposed for an SRAM-based FPGA used in space application. The p-type gate poly on p-substrate structure provides a radiation immune resistor and a capacitor for RC hardened signal path. In addition to area efficiency, the proposed cell also overcomes the traditional linear energy transfer sensitivity to process and temperature variation.

Inspec keywords: radiation hardening (electronics); SRAM chips; field programmable gate arrays

Other keywords: p-substrate structure; temperature variation; radiation immune capacitor; p-type poly gate; space application; bit cell design; SRAM cell design; RC hardened signal path; linear energy transfer sensitivity; radiation immune resistor; radiation hardened configuration; RC hardened FPGA configuration

Subjects: Logic circuits; Semiconductor storage; Logic and switching circuits; Memory circuits; Radiation effects (semiconductor technology)

References

    1. 1)
      • J.J. Wang . SRAM based re-programmable FPGA for space application. IEEE Trans. Nucl. Sci. , 6 , 1728 - 1735
    2. 2)
      • T. Calin , M. Nicolaidis , R. Velazco . Upset hardened memory design for submicron CMOS technology. IEEE Trans. Nucl. Sci. , 6 , 2874 - 2878
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