%0 Electronic Article
%A R.B. Keam
%K plane wave
%K Maxwell equations
%K subsurface measurement
%K homogeneous layers
%K linearly varying dielectric permittivity
%K dielectric material
%K layered media
%K Airy functions
%K impedance transformation
%X Sub-surface measurement of the properties of dielectric material often requires a model for referring impedance through the material and where the material has a dielectric permittivity that varies linearly with respect to depth. There are two common techniques for doing this. The derivation of the less common of the two techniques is described, followed by comparison of the performance of the techniques.
%@ 0013-5194
%T Impedance transformation through material of linearly varying dielectric permittivity: comparison of two common techniques
%B Electronics Letters
%D October 2002
%V 38
%N 22
%P 1318-1319
%I Institution of Engineering and Technology
%U https://digital-library.theiet.org/;jsessionid=6i1kue1042ou.x-iet-live-01content/journals/10.1049/el_20020930
%G EN