http://iet.metastore.ingenta.com
1887

Bit-wise read-compare-write scheme for low power read-modify-write DRAM operation

Bit-wise read-compare-write scheme for low power read-modify-write DRAM operation

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

To save power consumption in read-modify-write (RMW) DRAM operation, a bit-wise read-compare-write (RCW) scheme is presented. Its power consumption depends on the number of bits that have to be updated by the bit-wise compare result between the read data and the modified data. If a random bit-wise update ratio is assumed, a 11.6% power saving is achieved when the proposed scheme is applied to the previous design.

References

    1. 1)
      • Y.-H. Park , S.-H. Han , J.-H. Lee , H.-J. Yoo . A 7.1 GB/s low power rendering engine in 2D array embedded memory logic CMOS for portable multimedia system. IEEE J. Solid-State Circuits , 6 , 944 - 955
    2. 2)
      • K. Inoue , H. Nakamura , H. Kawai . A 10 Mb frame buffer memory with Z-compare and A-blend units. IEEE J. Solid-State Circuits , 12 , 1563 - 1568
    3. 3)
      • Kook, J., Yoo, H.-J.: `A single bit line writing scheme for low power reconfigurable I/O DRAM macro', IEEE European Solid-State Circuit Conference of Digest of Technical Paper, September 2000, p. 420–423.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_20020069
Loading

Related content

content/journals/10.1049/el_20020069
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address