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Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

Bismuth nano-Hall probes fabricated by focused ion beam milling for direct magnetic imaging by room temperature scanning Hall probe microscopy

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  • Author(s): A. Sandhu 1 ; H. Masuda 2 ; K. Kurosawa 3 ; A. Oral 4 ; S.J. Bending 5
    • View affiliations
    • Affiliations: 1: Department of Electrical and Electronic Engineering, Tokai University, Hiratsuka, Japan
      2: Department of Electrical and Electronic Engineering, Toei Kogyo Ltd., Machida, Japan
      3: Department of Electrical and Electronic Engineering, Hitachi Science Systems Ltd., Hitachinaka-shi, Japan
      4: Department of Physics, Bilkent University, Ankara, Turkey
      5: Department of Physics, University of Bath, Bath, United Kingdom
  • Source: Volume 37, Issue 22, 25 October 2001, p. 1335 – 1336
    DOI:  10.1049/el:20010908 , Print ISSN 0013-5194, Online ISSN 1350-911X
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Bismuth nano-Hall probes with dimensions ~120 × 120 nm were fabricated by focused ion beam milling and used for the direct room temperature magnetic imaging of crystalline garnet thin films and strontium ferrite permanent magnets by scanning Hall probe microscopy. At driving currents of 40 µA, the Hall coefficient and magnetic field sensitivity of the Bi nano-Hall probes were 3.3 × 10-4 Ω/G and 7.2 G/√Hz, respectively.

Inspec keywords: imaging; magnetic domains; probes; focused ion beam technology; scanning probe microscopy; Hall effect devices; magnetic sensors; bismuth

Other keywords: crystalline garnet thin films; Hall coefficient; Sr ferrite permanent magnets; room temperature scanning Hall probe microscopy; Bi nano-Hall probes; Bi; direct magnetic imaging; SrFe12O19; 40 muA; FIB milling; 120 nm; magnetic field sensitivity; focused ion beam milling

Subjects: Magnetic instruments and techniques; Sensing and detecting devices; Sensing devices and transducers; Bulk effect devices; Scanning probe microscopy and related techniques

References

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      • A. Oral , S.J. Bending . Scanning Hall probe microscopy of superconductors and magnetic materials. J. Vac. Sci. Technol. B , 1202 - 1205
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      • A. Sandhu , A. Oral , H. Masuda , S.J. Bending . Room temperature sub-micron magnetic imaging by scanning Hall probe microscopy. Jpn. J. Appl. Phys. , 4321 - 4324
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      • G. Jung , M. Ocio , Y. Paltiel , H. Shtrikman , E. Zeldov . Magnetic noise measurements using cross-correlated Hall sensor arrays. Appl Phys. Lett. , 359 - 361
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      • A. Sandhu , A. Oral , H. Masuda , S.J. Bending . Direct magnetic imaging of ferromagnetic domain structures by room temperaturescanning Hallprobe microscopy using a Bismuth micro-Hall probe. Jpn. J. Appl. Phys. , 524 - 527
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