Your browser does not support JavaScript!
http://iet.metastore.ingenta.com
1887

Numerical estimate of BER in optical systems with strong patterning effects

Numerical estimate of BER in optical systems with strong patterning effects

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

A statistical approach to numerical evaluation of bit error rates in optical transmission systems with strong patterning effects is described. As an example, a specific dispersion-managed WDM (40 Gbit/s per channel) system using transmission with large bit overlapping was examined.

References

    1. 1)
      • Goder, N., Settembre, M., Laedke, W., Matera, F., Gabitov, I., Haunstein, H., Reid, J., Turitsyn, S.: `Role of the Q-factor estimation in the field trial of 10 Gbit/s transmissionat 1300 nm with semiconductor optical amplifiersbetween Madrid and Merida (460 km)', WM44, OFC'99, 1999, p. 325–327.
    2. 2)
      • E. Iannone , F. Matera , A. Mecozzi , M. Settembre . (1998) Nonlinear optical communication networks.
    3. 3)
      • C.J. Anderson , J.A. Lyle . Technique for evaluating system performance using Q-factor in numericalsimulations exhibiting intersymbol interference. Electron. Lett. , 71 - 72
    4. 4)
      • N.S. Bergano , F.W. Kerfoot , C.R. Davidson . Margin measurements in optical amplifier systems. IEEE Photonics Technol. Lett. , 304 - 306
http://iet.metastore.ingenta.com/content/journals/10.1049/el_20010799
Loading

Related content

content/journals/10.1049/el_20010799
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address