http://iet.metastore.ingenta.com
1887

ESD-induced degradation of vertical-cavity surface-emitting lasers

ESD-induced degradation of vertical-cavity surface-emitting lasers

For access to this article, please select a purchase option:

Buy article PDF
$19.95
(plus tax if applicable)
Buy Knowledge Pack
10 articles for $120.00
(plus taxes if applicable)

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

The sensitivity of proton implanted, vertical-cavity surface-emitting lasers (VCSELs) to electrostatic discharge (ESD) pulses is investigated under human body model test conditions. Rather low degradation threshold pulse amplitudes were observed in forward bias (+1500 V) as well as reverse bias (–800 V) step stress tests. Monitoring both the electrical and optical parameters of the VCSELs during ESD stress, it was found that in forward bias ESD stress tests the optical degradation precedes the electrical degradation.

References

    1. 1)
      • U. Fiedler , G. Reiner , P. Schnitzer , K.J. Ebeling . Top surface-emitting vertical-cavity laser diodes for 10-Gb/s data transmission. IEEE Photonics Technol. Lett. , 746 - 748
    2. 2)
      • Hawthorne, R.A., Guenter, J.K., Granville, D.N., Hibbs-Brenner, M.K., Morgan, R.A.: `Reliability study of 850nm VCSELs for data communications', Proc. 34th IEEE Rel. Symp., 1996, p. 203–210.
    3. 3)
      • Cheng, Y.M., Herrick, R., Petroff, P.M., Hibbs-Brenner, M.K., Morgan, R.A.: `Degradation mechanisms of vertical cavity surface emitting lasers', Proc. 34th IEEE Rel. Symp., 1996, p. 211–213.
    4. 4)
      • `Sensitivity testing, Human Body Model, component level', ESD STM5.1, 1998.
    5. 5)
      • W. Jiang , C. Gaw , P. Kiely , B. Lawrence , M. Lebby , P.R. Claisse . Effect of protonimplantation on the degradation of GaAs/GaAlAs vertical cavity surface emitting lasers. Electron. Lett. , 137 - 139
    6. 6)
      • H.C. Neitzert , A. Piccirillo . Sensitivity of multimode bidirectional optoelectronicmodules to electrostatic discharges. Microelectron. Reliab. , 1863 - 1871
    7. 7)
      • Y. Twu , L.S. Cheng , S.N.G. Chu , F.R. Nash , K.W. Wang , P. Parayanthal . Semiconductor laser damage due to human-body-model electrostatic discharge. J. Appl. Phys. , 1510 - 1520
http://iet.metastore.ingenta.com/content/journals/10.1049/el_20001152
Loading

Related content

content/journals/10.1049/el_20001152
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading
This is a required field
Please enter a valid email address