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Second harmonic generation of thin LiNbO3 samples for acoustic wave devices

Second harmonic generation of thin LiNbO3 samples for acoustic wave devices

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The response of thin LiNbO3 samples bonded on substrates for acousto-optic devices operating above a few hundred MHz is often greatly reduced relative to that of bulk material. The technique reported in this Letter is for measurement of the second harmonic generation performance in the outer 75 nm of the sample. This is a sensitive monitor of the perfection of the crystalline lattice and reveals damage from sample preparation.

Inspec keywords: lithium compounds; nondestructive testing; bulk acoustic wave devices; acousto-optical devices; optical harmonic generation

Other keywords: acousto-optic devices; SHG performance measurement; NDT; sample preparation damage; thin LiNbO3 samples; crystalline lattice; surface optical SHG; materials testing; second harmonic generation; acoustic wave devices; LiNbO3; sensitive monitor

Subjects: Acousto-optical devices; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Materials testing; Nondestructive testing: optical methods; Acoustic wave devices

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