Second harmonic generation of thin LiNbO3 samples for acoustic wave devices

Access Full Text

Second harmonic generation of thin LiNbO3 samples for acoustic wave devices

For access to this article, please select a purchase option:

Buy article PDF
£12.50
(plus tax if applicable)
Add to cart
Buy Knowledge Pack
10 articles for £75.00
(plus taxes if applicable)
Add to cart

IET members benefit from discounts to all IET publications and free access to E&T Magazine. If you are an IET member, log in to your account and the discounts will automatically be applied.

Learn more about IET membership 

Recommend Title Publication to library

You must fill out fields marked with: *

Librarian details
Name:*
Email:*
Your details
Name:*
Email:*
Department:*
Why are you recommending this title?
Select reason:
 
 
 
 
 
Electronics Letters — Recommend this title to your library

Thank you

Your recommendation has been sent to your librarian.

© IEE
Published

The response of thin LiNbO3 samples bonded on substrates for acousto-optic devices operating above a few hundred MHz is often greatly reduced relative to that of bulk material. The technique reported in this Letter is for measurement of the second harmonic generation performance in the outer 75 nm of the sample. This is a sensitive monitor of the perfection of the crystalline lattice and reveals damage from sample preparation.

Inspec keywords: lithium compounds; nondestructive testing; bulk acoustic wave devices; acousto-optical devices; optical harmonic generation

Other keywords: acousto-optic devices; SHG performance measurement; NDT; sample preparation damage; thin LiNbO3 samples; crystalline lattice; surface optical SHG; materials testing; second harmonic generation; acoustic wave devices; LiNbO3; sensitive monitor

Subjects: Acousto-optical devices; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Optical harmonic generation, frequency conversion, parametric oscillation and amplification; Materials testing; Nondestructive testing: optical methods; Acoustic wave devices

References

    1. 1)
      • P.J.T. Nunn , J. Olivares , L. Spadoni , P.D. Townsend , D.E. Hole , B.J. Luff . Ion beam enhanced chemical etching of Nd:YAG for optical waveguides. Nucl. Instrum. Methods Phys. Res. B , 507 - 511
    2. 2)
      • G.V. Vázquez , P.D. Townsend , J. Rams , P. Taylor , R. Wood , G. Borstel , A. Krumins , D. Millers . (2000) Assessment of surface quality by SHG in oxide crystals, Defects and surface induced effects in advanced perovskites.
    3. 3)
      • Bagshaw, J., BAe Systems, Great Baddow, Chelmsford, Essex,UK, privatecommunications.
    4. 4)
      • G.V. Vázquez , J. Rams , P.D. Townsend , D.E. Hole . Improved surfacequality of Nd:YAG monitored by second harmonic generation. Opt. Commun. , 171 - 176
    5. 5)
      • J. Rams , J. Olivares , P.J. Chandler , P.D. Townsend . Improved surface quality of Nd:YAG monitored by second harmonic generation. J. Appl. Phys. , 5180 - 5183
http://iet.metastore.ingenta.com/content/journals/10.1049/el_20001099
Loading

Related content

content/journals/10.1049/el_20001099
pub_keyword,iet_inspecKeyword,pub_concept
6
6
Loading