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Evaluation of acceleration test for degradation of each layer in stacked amorphous silicon solar cell

Evaluation of acceleration test for degradation of each layer in stacked amorphous silicon solar cell

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The results of an evaluation of the degradation of each separate level and their subsequent recovery process for solar cells made of a three-layer stacked structure are presented. The spectral sensitivity characteristic and conversion efficiency are used as evaluation parameters. The results indicate that the degradation pattern for the bottom layer should be chosen as the standard as far as the evaluation of the overall conversion efficiency is concerned. This is because the absolute value of spectral sensitivity for the bottom layer is the smallest.

Inspec keywords: amorphous semiconductors; silicon; semiconductor device testing; solar cells; life testing; elemental semiconductors

Other keywords: acceleration test; recovery; Si; stacked amorphous silicon solar cell; spectral sensitivity; layer degradation; conversion efficiency

Subjects: Solar cells and arrays; Photoelectric conversion; solar cells and arrays

References

    1. 1)
      • Igari, S., Nose, J., Nakano, A., Shigekuni, T., Terashima, H.: `Output stability of various PV modules by long-term exposure test atJQA', Tech. Dig. PVSEC-9, 1996, p. 477–478.
    2. 2)
      • K. Takahisa , T. Kojima , K. Nakamura , T. Koyanagi , T. Yangisawa . Experimental model and long-term prediction of photovoltaic conversionefficiency of a-Si solar cells. Solar Energy Mat. Solar Cells , 179 - 182
    3. 3)
      • Yang, J., Banerjee, A., Gaha, S.: `Correlation of component cells with high efficiency amorphous siliconalloytriple-junction solar cells and modules', 2nd WCEPV, Proc. PVSEC, 1998, p. 387–390.
    4. 4)
      • Takahisa, K., Kojima, T., Nakamura, K., Koyanagi, T., Yangisawa, T.: `Stabilized efficiency of stacked a-Si solar cells', 2nd WCEPV, Proc. PVSEC, 1998, p. 777–780.
http://iet.metastore.ingenta.com/content/journals/10.1049/el_19991351
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