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Experimental analysis of transient current testing based on charge observation

Experimental analysis of transient current testing based on charge observation

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A test technique that uses the charge driven into the circuit computed from the transient power supply current is analysed. Experimental data are provided concerning the merits of this technique and its effectiveness at detecting open defects that do not increase the power consumption (those that cannot be detected with IDDQ).

Inspec keywords: logic testing; transient analysis; CMOS digital integrated circuits; integrated circuit testing

Other keywords: IC testing; charge observation; open defects; transient current testing; digital ICs; CMOS; logic testing; power consumption

Subjects: Semiconductor integrated circuit design, layout, modelling and testing; Digital circuit design, modelling and testing; CMOS integrated circuits

References

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      • Beasley, J., Righter, A., Apodaca, C., Pour-Mozafari, S., Huggett, D.: ` pulse responsetesting applied to complex CMOS ICs', Int. Test Conf., November 1997, p. 32–39.
    2. 2)
      • S.T. Su , R.Z. Makki , T. Nagle . Transient power supply current monitoring - A new testmethod for CMOS VLSI circuits. J. Electron. Testing: Theory Applic. , 23 - 43
    3. 3)
      • J.A. Segura , M. Roca , D. Mateo , A. Rubio . Built-in dynamic current sensor circuit fordigital VLSI CMOS testing. Electron. Lett. , 20 , 1668 - 1669
    4. 4)
      • V. Champac , J. Figueras , A. Rubio . Logic testability of defective floating gate CMOSlatches. Electron. Lett. , 25 , 2305 - 2306
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