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Reversed ROBDD circuits

Reversed ROBDD circuits

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A new class of logic circuits is proposed. Being derived from reduced ordered binary decision diagrams, these circuits inherit compactness and the ablility to represent very large switching functions. The reversed signal propagation results in low dynamic power consumption, complete single stuck-at fault testability and fault security. Simulation results are presented.

Inspec keywords: design for testability; switching functions; logic circuits; Boolean functions; logic design

Other keywords: fault security; reversed ROBDD circuits; binary decision diagrams; single stuck-at fault testability; switching functions; reduced ordered BDD circuits; logic circuits; reversed signal propagation; low dynamic power consumption

Subjects: Logic design methods; Formal logic; Logic circuits; Logic and switching circuits

References

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      • Almaini, A.E.A., Zhuang, N.: `Variable ordering of BDDs for multioutput Boolean functions using evolutionarytechniques', Fourth IEEE International Conference on Electronics, Circuitsand Systems, 1997, Cairo, p. 1239–1244.
    2. 2)
      • Drechsler, R., Becker, B.: `Dynamic minimization of OKFDDs', IEEE International Conference on Computer Design (ICCD), 1995, Austin, p. 602–607.
    3. 3)
      • R.E. Bryant . Graph-based algorithms for Boolean function manipulation. IEEE Trans. Comput. , 8 , 677 - 691
    4. 4)
      • Becker, B.: `Synthesis for testability: binary decision diagrams', STACS 92 Annual Symposium on Theoretical Aspects of ComputerScience, 1992, Berlin, p. 501–512.
    5. 5)
      • Anderson, D.A.: `Design of self-checking digital networks using coding techniques', R-527, Coordinated Science Laboratory Report, September 1971.
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