A new multiple twisted data line technique to reduce both bit-line and word-line coupling noises is proposed and demonstrated. An improved noise/signal ratio resulting from the application of the proposed technique is confirmed by soft-error rate tests. A faster data access time can also be expected when the proposed technique is incorporated into dynamic random access memories.
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http://iet.metastore.ingenta.com/content/journals/10.1049/el_19980933
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